DocumentCode :
977956
Title :
Ultra low noise Nb DC SQUIDs
Author :
Voss, R.F. ; Laibowitz, R.B. ; Broers, A.N. ; Raider, S.I. ; Knoedler, C.M. ; Viggiano, J.M.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, NY
Volume :
17
Issue :
1
fYear :
1981
fDate :
1/1/1981 12:00:00 AM
Firstpage :
395
Lastpage :
399
Abstract :
Electron-beam lithography has been used to produce ultra low noise Nb dc SQUIDs (Superconducting QUantum Interference Devices) with Josephson elements consisting of either small area tunnel junctions or very narrow variable thickness bridges (nanobridges). Detailed voltage noise and transfer function measurements have been made as a function of temperature and flux and current bias. These measurements allow a computation of the intrinsic energy resolution ε vs bias parameters as well as comparison with models of intrinsic SQUID noise. The best ε obtained was of order Planck´s constant h. Moreover, the detailed characteristics of the SQUID voltage noise are in agreement with a small signal analysis that depends only on the current noise in each of the Josephson elements and measurable parameters.
Keywords :
Josephson device noise; Current measurement; Interference; Josephson junctions; Lithography; Niobium; Noise measurement; SQUIDs; Superconducting device noise; Superconducting devices; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1981.1060901
Filename :
1060901
Link To Document :
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