• DocumentCode
    978030
  • Title

    Ga0.51In0.49P channel MESFET

  • Author

    Hashemi, Mahmood ; Kiziloglu, K. ; Shealy, James B. ; DenBaars, Steven P. ; Mishra, Umesh K.

  • Author_Institution
    Phoenix Corporate Res. Lab., Motorola Inc., Tempe, AZ, USA
  • Volume
    29
  • Issue
    24
  • fYear
    1993
  • Firstpage
    2154
  • Lastpage
    2155
  • Abstract
    High bandgap materials are extremely important for high temperature and high power electronic applications. GaInP is an attractive large bandgap material because it can be grown lattice matched to GaAs. The authors report the first GaInP channel MESFET. The material was grown by a non-hydride MOCVD technique using TBP as the phosphorus source. A 1 mu m gate length device had a drain current density of 300mA/mm, an extrinsic transconductance of 70mS/mm, a gate-drain breakdown voltage of 17V, with an fT and fmax of 10 and 25GHz, respectively.
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; gallium compounds; indium compounds; power transistors; 1 micron; 10 GHz; 25 GHz; 70 mS; Ga 0.51In 0.49P; GaInP channel MESFET; P source; TBP; drain current density; extrinsic transconductance; gate-drain breakdown voltage; high power electronic applications; high temperature; large bandgap material; nonhydride MOCVD technique;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19931440
  • Filename
    247630