Title :
Optics for Infrared Systems
Author_Institution :
The Perkin-Elmer Corp., Norwalk, Conn.
Keywords :
Apertures; Infrared detectors; Infrared imaging; Lenses; Mirrors; Optical diffraction; Optical refraction; Optical surface waves; Size measurement; Wavelength measurement;
Journal_Title :
Proceedings of the IRE
DOI :
10.1109/JRPROC.1959.287056
