Title :
Microwave power spectra of variable thickness sub-micron bridges
Author :
Schwartz, D.B. ; Mankiewich, P.M. ; Jain, A.K. ; Lukens, J.E.
Author_Institution :
State University of New York, Stony Brook, NY
fDate :
1/1/1981 12:00:00 AM
Abstract :
The frequency variation of the radiated power and linewidth of variable thickness bridges from 2 to 18 GHz is reported. A new, simple technique for fabricating these bridges using electron beam lithography is described. The measured power is found to be in unexpectedly good agreement with that calculated using the resistively shunted junction model. The linewidth data are in striking disagreement with existing theories.
Keywords :
Electron-beam applications; Josephson device oscillators; Microwave oscillators; Bridge circuits; Coaxial cables; Electrical resistance measurement; Electron beams; Foot; Frequency; Indium; Laboratories; Lithography; Power measurement;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1981.1060929
