Title :
Graphic image coding based on a pattern-dependent runlength model
Author :
Shim, Y.S. ; Kim, J.K.
Author_Institution :
Korea Advanced Institute of Science & Technology, Department of Electrical Engineering, Seoul, Korea
Abstract :
A new graphic image coding based on a pattern-dependent runlength model is investigated. The binary image is considered as a concatenation of alternating white and black runs the probability of occurrence of which is dependent on the pattern of neighbouring runs. Based on this model, an optimum coding strategy is obtained for the case of simplified composite states. Simulation results show its better performance over conventional schemes.
Keywords :
encoding; picture processing; binary image; graphic image coding; pattern-dependent runlength model; simplified composite states;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19820324
