• DocumentCode
    978365
  • Title

    A decorrelation-based Monte Carlo simulation—Its application to yield statistics of charge-redistribution A/D converters

  • Author

    Lee, Y.T. ; Kyung, C.M. ; Kim, C.K.

  • Author_Institution
    Samsung Semiconductor and Telecommunications Inc., Suwon, Korea
  • Volume
    74
  • Issue
    5
  • fYear
    1986
  • fDate
    5/1/1986 12:00:00 AM
  • Firstpage
    749
  • Lastpage
    751
  • Abstract
    A Monte Carlo method for yield estimation in charge-redistribution A/D converters is described, where the capacitances are random variables with finite correlation among themselves. The symmetric property of the resultant covariance matrix was exploited to decorrelate the random variables into another set of independent random variables.
  • Keywords
    Capacitance; Capacitors; Circuits; Covariance matrix; Decorrelation; Monte Carlo methods; Random variables; State-space methods; Statistics; Transmission line matrix methods;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1986.13538
  • Filename
    1457806
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=978365