Title :
Nb based Te barrier Josephson junctions
Author :
Nagata, Koichi ; Uehara, Satoshi ; Matsuda, Azusa ; Takayanagi, Hideaki
Author_Institution :
Nippon Telegraph and Telephone Public Corporation, Tokyo, Japan
fDate :
1/1/1981 12:00:00 AM
Abstract :
A study was made on Nb based Josephson junctions with evaporated Te barriers. As the first step, a Nb-Te-Pb configuration was tested. The smooth surfaced Nb electrode enabled the formation of a pinhole free barrier. Supercurrent density was found to be large compared to that for surface oxidized junctions. As the second step, a Nb-Te-Nb structure was tested. Although the junction uniformity was not as good as that of the Nb-Te-Pb junctions, the aging property was drastically improved. Considerations were made on the origin of the remaining aging. The junctions showed excellent response to 50 GHz signals.
Keywords :
Josephson devices; Aging; Conductive films; Electrodes; Gold; Josephson junctions; Magnetic field measurement; Niobium; Oxidation; Semiconductor films; Tellurium;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1981.1060943
