• DocumentCode
    978592
  • Title

    FDTD calculation of scattering from frequency-dependent materials

  • Author

    Luebbers, Raymond ; Steich, David ; Kunz, Karl

  • Author_Institution
    Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA
  • Volume
    41
  • Issue
    9
  • fYear
    1993
  • fDate
    9/1/1993 12:00:00 AM
  • Firstpage
    1249
  • Lastpage
    1257
  • Abstract
    An efficient method to include frequency-dependent materials in finite difference time domain calculations based on the recursive evaluation of the convolution of the electric field and the susceptibility function has previously been presented. The method has been applied to various materials, including those with the Debye, Drude, and Lorentz forms of complex permittivity, and to anisotropic magnetized plasmas. Previous demonstrations of this approach have been confined to total field calculations in one dimension. In this paper the recursive convolution method is extended to three-dimensional scattered field calculations. The accuracy of the method is demonstrated by calculating scattering from spheres of various sizes composed of three different types of frequency-dependent materials
  • Keywords
    electromagnetic wave propagation in plasma; electromagnetic wave scattering; finite difference time-domain analysis; permittivity; radar cross-sections; Debye complex permittivity; Drude complex permittivity; FDTD calculation; Lorentz complex permittivity; anisotropic magnetized plasmas; electric field; electromagnetic scattering; finite difference time domain calculations; frequency-dependent materials; recursive convolution method; susceptibility function; three-dimensional scattered field calculations; Anisotropic magnetoresistance; Convolution; Finite difference methods; Frequency; Magnetic confinement; Magnetic materials; Permittivity; Plasma confinement; Scattering; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.247751
  • Filename
    247751