DocumentCode :
978630
Title :
Process test chip for Josephson integrated circuits
Author :
Klepner, S.P.
Author_Institution :
IBM T. J. Watson Research Center, Yorktown Heights, NY, USA
Volume :
17
Issue :
1
fYear :
1981
fDate :
1/1/1981 12:00:00 AM
Firstpage :
282
Lastpage :
285
Abstract :
Process test chips are fabricated along with chips containing experimental circuits in our laboratory in order to aid in forming a data base to characterize the technology. All the test sites are placed on a 6.35mm × 6.35mm chip with two distinct final wiring patterns. Wafers containing two chips of both types are processed along with the other substrates. Testing is done at the end of the run. Sites containing repetitive elements are populated at 1-10% of LSI density.
Keywords :
Integrated circuit testing; Josephson devices; Circuit testing; Conductivity; Critical current; Current measurement; Electrical resistance measurement; Insulation; Integrated circuit testing; Resistors; Voltage; Wiring;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1981.1060966
Filename :
1060966
Link To Document :
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