DocumentCode :
978646
Title :
Jitter analysis of high-speed sampling systems
Author :
Shinagawa, Mitsuru ; Akazawa, Yukio ; Wakimoto, Tsutomu
Author_Institution :
LSI Lab., NTT, Kanagawa, Japan
Volume :
25
Issue :
1
fYear :
1990
fDate :
2/1/1990 12:00:00 AM
Firstpage :
220
Lastpage :
224
Abstract :
The jitter of such practical sampling systems as analog-to-digital converters, sample-and-hold circuits, and samplers is discussed. A model for estimating jitter is proposed. In this model, total jitter is composed of sampling circuit jitter, analog input signal jitter, and sampling clock jitter. Using this model, jitter is broken up into three components. To evaluate the model, a precise method for measuring jitter is devised. This method, based on sampling sine-wave signal-to-noise ratio calculations, enables separation of jitter and amplitude noise. The performance limit of converters as evaluated by the model is discussed
Keywords :
analogue-digital conversion; modelling; random noise; sample and hold circuits; stability; A/D convertors; ADC; analog input signal jitter; high-speed sampling systems; jitter analysis; model; sample/hold circuits; samplers; sampling circuit jitter; sampling clock jitter; sine wave SNR calculations; Circuit noise; Circuit synthesis; Clocks; Harmonic distortion; Jitter; Large scale integration; Noise level; Sampling methods; Signal generators; Signal to noise ratio;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.50307
Filename :
50307
Link To Document :
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