• DocumentCode
    978646
  • Title

    Jitter analysis of high-speed sampling systems

  • Author

    Shinagawa, Mitsuru ; Akazawa, Yukio ; Wakimoto, Tsutomu

  • Author_Institution
    LSI Lab., NTT, Kanagawa, Japan
  • Volume
    25
  • Issue
    1
  • fYear
    1990
  • fDate
    2/1/1990 12:00:00 AM
  • Firstpage
    220
  • Lastpage
    224
  • Abstract
    The jitter of such practical sampling systems as analog-to-digital converters, sample-and-hold circuits, and samplers is discussed. A model for estimating jitter is proposed. In this model, total jitter is composed of sampling circuit jitter, analog input signal jitter, and sampling clock jitter. Using this model, jitter is broken up into three components. To evaluate the model, a precise method for measuring jitter is devised. This method, based on sampling sine-wave signal-to-noise ratio calculations, enables separation of jitter and amplitude noise. The performance limit of converters as evaluated by the model is discussed
  • Keywords
    analogue-digital conversion; modelling; random noise; sample and hold circuits; stability; A/D convertors; ADC; analog input signal jitter; high-speed sampling systems; jitter analysis; model; sample/hold circuits; samplers; sampling circuit jitter; sampling clock jitter; sine wave SNR calculations; Circuit noise; Circuit synthesis; Clocks; Harmonic distortion; Jitter; Large scale integration; Noise level; Sampling methods; Signal generators; Signal to noise ratio;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.50307
  • Filename
    50307