• DocumentCode
    978767
  • Title

    Considering noise orbital deviations on the evaluation of power density spectrum of oscillators

  • Author

    Carbone, Adriano ; Palma, Fabrizio

  • Author_Institution
    Dipt. di Ingegneria Elettronica, Universita di Roma "La Sapienza", Rome
  • Volume
    53
  • Issue
    6
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    438
  • Lastpage
    442
  • Abstract
    This brief presents a new application of the theory of noise in free running oscillators based on the Floquet eigenvector decomposition. In oscillators, all orbital deviations contribute to the power density spectrum (PDS) as much as the "phase" term, usually considered. Each orbital deviation component shows a time evolution depending on the related Floquet eigenvalue, which thus characterizes statistical properties related to that component. Orbital deviations are partially correlated, due to their common origin from noise sources, thus also correlation terms are considered in the evaluation of the PDS. In this brief, we introduce a simplified method of calculation of PDS and apply it to an example of RLC negative resistance oscillator. Results show the relevance of orbital deviations in PDS in presence of stationary noise, these contributions becomes particularly relevant when noise is cyclostationary
  • Keywords
    circuit noise; eigenvalues and eigenfunctions; oscillators; spectral analysis; statistical analysis; Floquet eigenvalue; Floquet eigenvector decomposition; RLC negative resistance oscillator; free running oscillators; noise orbital deviations; noise sources; power density spectrum; stationary noise; statistical properties; Autocorrelation; Degradation; Differential equations; Eigenvalues and eigenfunctions; Linear systems; Nonlinear dynamical systems; Orbital calculations; Oscillators; State-space methods; Stochastic processes; Floquet eigenvector decomposition; orbital deviation; oscillator noise; oscillators;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2006.873527
  • Filename
    1643457