DocumentCode :
978950
Title :
Strain scaling law for flux pinning in NbTi, Nb3Sn, Nb-Hf/Cu-Sn-Ga, V3Ga and Nb3Ge
Author :
Ekin, J.W.
Author_Institution :
National Bureau of Standards, Boulder, Colorado
Volume :
17
Issue :
1
fYear :
1981
fDate :
1/1/1981 12:00:00 AM
Firstpage :
658
Lastpage :
661
Abstract :
Critical current and flux pinning densities have been determined for a series of practical conductors as a function of uniaxial tensile strain in magnetic fields ranging from 4 T to 19 T. An empirical relation has been found at 4.2 K that accurately describes these data over the entire range of field under both compressive and tensile strain. The pinning force F has been found to obey a scaling law of the form: F = [B*_{c2}(\\varepsilon )]^{n} f(b) where f(b) is a function only of the reduced magnetic field b \\equiv B/B*_{c2} , and B*_{c2} is the strain dependent upper-critical field determined from high-field critical-current measurements. This strain scaling law was found to hold for all superconductors examined thus far, including commercial multifilamentary wire, mono-filamentary conductors, CVD tapes, extremely fine-filament conductors, partially-reacted specimens, and "in-situ" cast conductors. For Nb3Sn, n \\cong 1.0 , for Nb3Sn with Hf and Ga additions, n \\cong 1.2 , for V3Ga, n \\cong 1.4 , for Nb3Ge, n \\cong 1.6 , and for NbTi, n \\cong 4 . The importance of this relationship is that, for these conductors at least, it is possible to measure F at one strain and then immediately be able to predict F (and thus Jc) at other strain levels simply by scaling the results by [B*_{c2}(\\varepsilon )]^{n} . The relation between strain scaling and temperature scaling is discussed as it relates to flux pinning theories.
Keywords :
Mechanical factors; Superconducting materials; Capacitive sensors; Conductors; Flux pinning; Force measurement; Magnetic field induced strain; Magnetic field measurement; Niobium compounds; Strain measurement; Tensile strain; Titanium compounds;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1981.1060997
Filename :
1060997
Link To Document :
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