Title :
Submicron niobium tunnel junctions with reactive ion beam oxidation
Author :
Kleinsasser, A.W. ; Hunt, B.D. ; Callegari, A.C. ; Rogers, C. ; Tiberio, R. ; Buhrman, R.A.
Author_Institution :
Cornell University, Ithaca, NY
fDate :
1/1/1981 12:00:00 AM
Keywords :
Ion-beam applications; Josephson devices; Argon; Critical current density; Current density; Hysteresis; Ion beams; Knee; Niobium; Optical scattering; Oxidation; Tunneling;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1981.1061006
