Title :
Methodology for fast identification of EMIinduced operating point shift in analogue circuits
Author :
Loeckx, J. ; Gielen, G.
Author_Institution :
Dept. Elektrotech., Katholieke Univ. Leuven, Leuven
Abstract :
One of the major harmful effects of electromagnetic interference (EMI) is the change of the DC operating point of a circuit due to rectification caused by the interference signals. A methodology is presented that gives designers an accurate estimate of the operating point shift and that identifies the devices that are the key contributors.
Keywords :
analogue circuits; electromagnetic interference; rectification; EMI; analogue circuits; electromagnetic interference; interference signals; operating point shift; rectification;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20071584