Elimination of scan blindness in phased array of microstrip patches using electromagnetic bandgap materials

Electromagnetic bandgap (EBG) material is applied in the design of a phased array of rectangular microstrip patches. The surface-waves could be suppressed by the frequency bandgap and, therefore, the scan blindness could be eliminated. A high-impedance surface is chosen as EBG structure, and the numerical simulation is performed by periodic Green´s functions plus the moment method. Both the bandgap curve of the EBG structure and the scan characteristics of the phased arrays have been calculated. The elimination of scan blindness is observed.