DocumentCode :
979100
Title :
Origin of the improved resistance to strain of in situ Nb3 Sn multifilamentary composites
Author :
Lanteigne, J. ; Roberge, R. ; LeHuy, H. ; Fihey, J.L. ; Foner, S.
Author_Institution :
Institut de recherche d́Hydro-Québec, Varennes, Québec, Canada
Volume :
17
Issue :
1
fYear :
1981
fDate :
1/1/1981 12:00:00 AM
Firstpage :
265
Lastpage :
269
Abstract :
For in situ or ultra-fine multifilamentary Cu-Nb-Sn, the Jc maximum versus strain varies from strain values of 
% for the smallest interfilament spacing to 0.2 - 0.3% for the largest interfilament spacing. Finite element analysis is used to calculate the residual stress (and strain) components from the thermal contraction and to obtain the stress-strain curves following uniaxial loading. The influence of the superconducting volume fraction and the plasticity of the matrix are included in the analysis. One of the most important features is the net reduction of the residual tensile stress on the matrix which occurs when the configuration is changed from a monofilament to multifilament.
% for the smallest interfilament spacing to 0.2 - 0.3% for the largest interfilament spacing. Finite element analysis is used to calculate the residual stress (and strain) components from the thermal contraction and to obtain the stress-strain curves following uniaxial loading. The influence of the superconducting volume fraction and the plasticity of the matrix are included in the analysis. One of the most important features is the net reduction of the residual tensile stress on the matrix which occurs when the configuration is changed from a monofilament to multifilament.Keywords :
Superconducting materials; Capacitive sensors; Compressive stress; Finite element methods; Multifilamentary superconductors; Niobium; Niobium-tin; Temperature; Tensile stress; Thermal stresses; Tin;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1981.1061011
Filename :
1061011
Link To Document :
