DocumentCode :
979298
Title :
UTD propagation model in an urban street scene for microcellular communications
Author :
Tan, S.Y. ; Tan, H.S.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Volume :
35
Issue :
4
fYear :
1993
fDate :
11/1/1993 12:00:00 AM
Firstpage :
423
Lastpage :
428
Abstract :
A three-dimensional propagation model for microcellular communications in an urban street scene is presented. The model is based on the uniform theory of diffraction (UTD) and takes into account multiple wall-to-wall, wall-to-ground, and ground-to-wall reflections, the diffraction from corners of buildings, and subsequent reflections from such diffracted signals. The ray geometry is made extremely complex by the presence of ground reflections and the many combinations of sequences of reflections or diffractions from walls, edges, and ground. At each reflection or diffraction point, the local ray-fixed coordinate system or edge-fixed coordinate system is used together with appropriate dyadic reflection or diffraction coefficient matrices. The theoretical results for the signal path loss along the streets are compared with measurements done in New York and Tokyo for various values of the propagation parameters. Agreement with these measurements indicates that the UTD formulation is a good model for such urban communication applications
Keywords :
cellular radio; electromagnetic wave diffraction; electromagnetic wave reflection; radiowave propagation; New York; Tokyo; UTD; diffraction coefficient matrices; dyadic reflection; edge-fixed coordinate system; ground-to-wall reflections; local ray-fixed coordinate system; microcellular communications; signal path loss; three-dimensional propagation model; uniform theory of diffraction; urban street scene; wall-to-ground reflections; wall-to-wall reflections; Electromagnetic scattering; Layout; Physical theory of diffraction; Polarization; Predictive models; Propagation losses; Reflection; Roads; Solid modeling; Surface waves;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.247854
Filename :
247854
Link To Document :
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