• DocumentCode
    979322
  • Title

    Modeling of Effect of Plastic Deformation on Barkhausen Noise and Magnetoacoustic Emission in Iron With 2% Silicon

  • Author

    Sablik, M.J. ; Augustyniak, Boleslaw ; de Campos, Marcos F. ; Landgraf, F.

  • Author_Institution
    Southwest Res. Inst., San Antonio, TX
  • Volume
    44
  • Issue
    11
  • fYear
    2008
  • Firstpage
    3221
  • Lastpage
    3224
  • Abstract
    Before one models the effect of plastic deformation on magnetoacoustic emission (MAE), one must first treat non-180deg domain wall motion. In this paper, we take the Alessandro-Beatrice-Bertotti-Montorsi (ABBM) model and modify it to treat non-180deg wall motion. We then insert a modified stress-dependent Jiles-Atherton model, which treats plastic deformation, into the modified ABBM model to treat MAE and magnetic Barkhausen noise (HBN). In fitting the dependence of these quantities on plastic deformation, we apply a model for when deformation gets into the stage where dislocation tangles are formed, noting two chief effects, one due to increased density of emission centers owing to increased dislocation density, and the other due to a more gentle increase in the residual stress in the vicinity of the dislocation tangles as deformation is increased.
  • Keywords
    Barkhausen effect; dislocation density; internal stresses; iron; magnetic domain walls; magnetic noise; magnetoacoustic effects; plastic deformation; silicon; Alessandro-Beatrice-Bertotti-Montorsi model; Barkhausen noise; Fe-Si; dislocation density; dislocation tangles; domain wall motion; iron; magnetoacoustic emission; modified stress-dependent Jiles-Atherton model; plastic deformation; residual stress; silicon; Deformable models; Iron; Magnetic domain walls; Magnetic domains; Magnetic noise; Permeability; Plastics; Production; Silicon; Stress; Iron-silicon steel; magnetic Barkhausen noise; magnetoacoustic emission; plastic deformation;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2008.2002803
  • Filename
    4667646