• DocumentCode
    979431
  • Title

    The role of disorder in maximizing the upper critical field in the Nb-Sn system

  • Author

    Orlando, T.P. ; Alexander, J.A. ; Bending, S.J. ; Kwo, J. ; Poon, S.J. ; Hammond, R.H. ; Beasley, M.R. ; McNiff, E.J., Jr. ; Foner, S.

  • Author_Institution
    Stanford University, California
  • Volume
    17
  • Issue
    1
  • fYear
    1981
  • fDate
    1/1/1981 12:00:00 AM
  • Firstpage
    368
  • Lastpage
    369
  • Abstract
    We have measured the transition temperature Tc, upper critical field Hc2(T) and the resistivity above Tc, ρTc, for thin films of electron beam co-evaporated Nb-Sn which were deposited as Nb3Sn at various substrate temperatures, or off-stoichiometry, or with tertiary additions of Al or Zr. The Tcand Hc2correlate with the resistivity, no matter how the materials were made. A maximum Hc2(0) of about 300 kOe occurs when ρTc∼ 30 μΩ-cm and the corresponding Tc∼ 16 K; also Hc2shows no sign of Pauli limiting.
  • Keywords
    Superconducting materials; Conductivity; Laboratories; Magnetic field measurement; Niobium-tin; Superconducting magnets; Superconducting transition temperature; Superconductivity; Temperature measurement; Tin; Zirconium;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1981.1061041
  • Filename
    1061041
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=979431