• DocumentCode
    979530
  • Title

    Design Considerations for Integrated Electronic Devices

  • Author

    Wallmark, J.T.

  • Author_Institution
    RCA Labs., Princeton, N.J.
  • Volume
    48
  • Issue
    3
  • fYear
    1960
  • fDate
    3/1/1960 12:00:00 AM
  • Firstpage
    293
  • Lastpage
    300
  • Abstract
    Some fundamental factors affecting the design of integrated electronic devices are discussed, particularly the influence of shrinkage. It is concluded that the considerable advantages of integrated devices, compared to conventional devices, such as very small volume and weight, and reduced number of metallic connections, have to be paid for by higher shrinkage in fabrication. Three considerations are advanced, which will reduce partially this higher shrinkage. First, the resulting increase in cost may be made very small if the design of the integrated device allows the extent of integration to be adjusted to the shrinkage rate. Second, the resultant high cost of the integrated device justifies a higher investment in the fabrication process of the integrated devices than for the individual units. Third, methods of doctoring integrated devices may be used to reduce the shrinkage effectively.
  • Keywords
    Costs; Delay lines; Electron devices; Fabrication; Integrated circuit interconnections; Logic devices; Semiconductor devices; Shift registers; Solids; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1960.287597
  • Filename
    4066016