DocumentCode
979744
Title
Development of critical current measurement standards
Author
Segal, H.R. ; Stekly, Z. J J ; De Winter, T.A.
Author_Institution
Magnetic Corporation of America, Waltham, Massachusetts
Volume
17
Issue
1
fYear
1981
fDate
1/1/1981 12:00:00 AM
Firstpage
73
Lastpage
76
Abstract
This paper deals with the development of criteria for critical current measurements. The two tasks investigated were: (1) the determination of critical current of short samples as a function of transition criterion, and (2) analysis of current transfer from sample holder to sample. Critical currents were measured using the equivalent resistivity criterion with sensitivities ranging from 10-7Ω-cm to 10-12Ω-cm and using the electric field criterion with sensitivities of 1 mV/cm to 100 nV/cm. Current transfer measurements were performed on monolithic conductors with critical currents greater than 1,000 amps. The results of the program are that no single measurement standard and no single test holder are suitable for all types of critical current measurements, and that sample holders must be designed with sufficiently large copper current contacts in order to minimize current transfer effects.
Keywords
Current measurement standards; Superconducting materials; Conductivity; Critical current; Current measurement; Fixtures; Magnetic field measurement; Measurement standards; Performance evaluation; Superconducting magnets; Testing; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1981.1061072
Filename
1061072
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