• DocumentCode
    979822
  • Title

    Comparison of current-switched logic gates for high-speed communications applications

  • Author

    Sharratt, A.A. ; Ward, S.

  • Author_Institution
    Dept. of Electron. Eng., Polytech., Huddersfield, UK
  • Volume
    25
  • Issue
    1
  • fYear
    1990
  • fDate
    2/1/1990 12:00:00 AM
  • Firstpage
    307
  • Lastpage
    309
  • Abstract
    Emitter-coupled current-switched logic circuits are compared for high-speed communications applications on the basis of delay versus power dissipation for a fixed noise margin. Standard 2.5-μm and oxide-isolated 1.5-μm fabrication processes are considered. Variable-threshold logic offers the lowest delays, but at the expense of increased power dissipation
  • Keywords
    bipolar integrated circuits; circuit analysis computing; delays; emitter-coupled logic; integrated logic circuits; logic gates; 1.5 micron; 2.5 micron; ECL; HSPICE; bipolar IC; current-switched logic gates; delay; digital simulation; emitter coupled logic circuits; fixed noise margin; high-speed communications applications; oxide isolated fabrication process; power dissipation; standard fabrication process; variable threshold logic; Circuit noise; Delay; Fabrication; Feedback circuits; Logic circuits; Logic gates; Negative feedback; Power dissipation; Switches; Telecommunications;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.50318
  • Filename
    50318
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=979822