• DocumentCode
    979937
  • Title

    Use of incoherent light for annealing implanted Si wafers and growing single-crystal Si on SiO2

  • Author

    Haond, M. ; Vu, D.P.

  • Author_Institution
    CNET, Centre Norbert Segard, Meylan, France
  • Volume
    18
  • Issue
    17
  • fYear
    1982
  • Firstpage
    727
  • Lastpage
    728
  • Abstract
    By using halogen lamps, we have annealed implanted Si wafers and recrystallised deposited poly-Si. A transient anneal was accomplished with a good uniformity on 4 in Si wafers with no redistribution of the dopant profile. By using a shaped spot, we obtained ¿100¿ single-crystal Si, over an area 2 mm by several centimetres, on a SiO2 layer grown on a Si substrate, without seeding.
  • Keywords
    annealing; elemental semiconductors; ion implantation; radiation effects; recrystallisation annealing; semiconductor growth; silicon; 4 in. Si wafers; Si single crystal growth; SiO2 layer; annealing; dopant profile; halogen lamps; implanted Si wafers; incoherent light; recrystallised deposited poly-Si; semiconductor; transient anneal;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19820493
  • Filename
    4246732