DocumentCode
979937
Title
Use of incoherent light for annealing implanted Si wafers and growing single-crystal Si on SiO2
Author
Haond, M. ; Vu, D.P.
Author_Institution
CNET, Centre Norbert Segard, Meylan, France
Volume
18
Issue
17
fYear
1982
Firstpage
727
Lastpage
728
Abstract
By using halogen lamps, we have annealed implanted Si wafers and recrystallised deposited poly-Si. A transient anneal was accomplished with a good uniformity on 4 in Si wafers with no redistribution of the dopant profile. By using a shaped spot, we obtained ¿100¿ single-crystal Si, over an area 2 mm by several centimetres, on a SiO2 layer grown on a Si substrate, without seeding.
Keywords
annealing; elemental semiconductors; ion implantation; radiation effects; recrystallisation annealing; semiconductor growth; silicon; 4 in. Si wafers; Si single crystal growth; SiO2 layer; annealing; dopant profile; halogen lamps; implanted Si wafers; incoherent light; recrystallised deposited poly-Si; semiconductor; transient anneal;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19820493
Filename
4246732
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