DocumentCode :
979937
Title :
Use of incoherent light for annealing implanted Si wafers and growing single-crystal Si on SiO2
Author :
Haond, M. ; Vu, D.P.
Author_Institution :
CNET, Centre Norbert Segard, Meylan, France
Volume :
18
Issue :
17
fYear :
1982
Firstpage :
727
Lastpage :
728
Abstract :
By using halogen lamps, we have annealed implanted Si wafers and recrystallised deposited poly-Si. A transient anneal was accomplished with a good uniformity on 4 in Si wafers with no redistribution of the dopant profile. By using a shaped spot, we obtained ¿100¿ single-crystal Si, over an area 2 mm by several centimetres, on a SiO2 layer grown on a Si substrate, without seeding.
Keywords :
annealing; elemental semiconductors; ion implantation; radiation effects; recrystallisation annealing; semiconductor growth; silicon; 4 in. Si wafers; Si single crystal growth; SiO2 layer; annealing; dopant profile; halogen lamps; implanted Si wafers; incoherent light; recrystallised deposited poly-Si; semiconductor; transient anneal;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19820493
Filename :
4246732
Link To Document :
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