A novel EER structure for reducing complexity using negative resistance amplifier

Author

Jeon, Young-Sang ; Yang, Hoe-Sung ; Nam, Sangwook

Author_Institution

Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., South Korea

Volume

14

Issue

5

fYear

2004

fDate

5/1/2004 12:00:00 AM

Firstpage

195

Lastpage

197

Abstract

This letter presents a novel envelope elimination and restoration (EER) structure using the negative resistance class F power amplifier. Due to the extremely high gain characteristic of the negative resistance amplifier in very narrow bandwidth, it operates in saturation mode. This characteristic is applied to the proposed EER. Using this technique, a limiter, a drive amplifier, and a class F power amplifier in conventional EER can be substituted with the negative resistance class F power amplifier. This technique greatly reduces the complexity of conventional EER without degradation of efficiency and linearity. The measured results show efficiency of 60% and less than-26 dBc IMD levels for two-tone test in PCS band at 27-dBm output power.

Keywords

circuit complexity; negative resistance devices; power amplifiers; 60 percent; EER structure; class F power amplifier; complexity reduction; drive amplifier; envelope elimination; high gain characteristic; limiter circuit; negative resistance amplifier; restoration structure; Bandwidth; Degradation; Envelope detectors; Linearity; Personal communication networks; Power amplifiers; Power generation; Radio frequency; Radiofrequency amplifiers; Signal restoration; EER; negative resistance amplifier;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2004.827845

Filename

1296658