• DocumentCode
    980141
  • Title

    High-mobility Ga0.47In0.53As thin epitaxial layers grown by MBE, very closely lattice-matched to InP

  • Author

    Massies, J. ; Rochette, J. ; Delescluse, P. ; Etienne, P. ; Chevrier, J. ; Linh, Nuyen T.

  • Author_Institution
    Thomson-CSF, Central Research Laboratory, Orsay, France
  • Volume
    18
  • Issue
    18
  • fYear
    1982
  • Firstpage
    758
  • Lastpage
    760
  • Abstract
    Thin epitaxial layers (< 1.5 ¿m) of Ga0.47In0.53As were grown by molecular beam epitaxy, very closely lattice-matched to InP, despite a nonrotating substrate holder. Hall mobilities were measured as a function of temperature in the dark and on illumination. At low temperature, the peak mobility of undoped layers lies between 35000 and 40000 cm2V¿1s¿1 in the dark and increases up to 45000 cm2V¿1s¿1 when measured in the light. Preliminary results obtained on slightly Sn-doped layers are also reported.
  • Keywords
    Hall effect; III-V semiconductors; carrier mobility; gallium arsenide; indium compounds; molecular beam epitaxial growth; semiconductor epitaxial layers; Ga0.47In0.53As thin epitaxial layers; Hall mobility; III-V semiconductors; InP; MBE; Sn-doped layers; illumination; lattice matching;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19820513
  • Filename
    4246774