DocumentCode
980141
Title
High-mobility Ga0.47In0.53As thin epitaxial layers grown by MBE, very closely lattice-matched to InP
Author
Massies, J. ; Rochette, J. ; Delescluse, P. ; Etienne, P. ; Chevrier, J. ; Linh, Nuyen T.
Author_Institution
Thomson-CSF, Central Research Laboratory, Orsay, France
Volume
18
Issue
18
fYear
1982
Firstpage
758
Lastpage
760
Abstract
Thin epitaxial layers (< 1.5 ¿m) of Ga0.47In0.53As were grown by molecular beam epitaxy, very closely lattice-matched to InP, despite a nonrotating substrate holder. Hall mobilities were measured as a function of temperature in the dark and on illumination. At low temperature, the peak mobility of undoped layers lies between 35000 and 40000 cm2V¿1s¿1 in the dark and increases up to 45000 cm2V¿1s¿1 when measured in the light. Preliminary results obtained on slightly Sn-doped layers are also reported.
Keywords
Hall effect; III-V semiconductors; carrier mobility; gallium arsenide; indium compounds; molecular beam epitaxial growth; semiconductor epitaxial layers; Ga0.47In0.53As thin epitaxial layers; Hall mobility; III-V semiconductors; InP; MBE; Sn-doped layers; illumination; lattice matching;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19820513
Filename
4246774
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