• DocumentCode
    980407
  • Title

    The influence of self-coupling in Josephson junctions on the lower threshold of the I-V characteristic

  • Author

    Erne, S.N. ; Lubbig, H.

  • Author_Institution
    Institut Berlin, Berlin, Germany
  • Volume
    17
  • Issue
    1
  • fYear
    1981
  • fDate
    1/1/1981 12:00:00 AM
  • Firstpage
    807
  • Lastpage
    808
  • Abstract
    A study of a dc-current biased retarded tunnel junction is presented. The influence of self-coupling on the hysteresis-characteristic is reported for vanishingly small temperature.
  • Keywords
    Josephson devices; Capacitance; Critical current; Current density; Differential equations; Hysteresis; Josephson junctions; Kernel; Temperature; Threshold voltage; Zero voltage switching;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1981.1061132
  • Filename
    1061132
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=980407