DocumentCode :
980915
Title :
DC SQUIDs 1980: The state of the art
Author :
Ketchen, M.B.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA
Volume :
17
Issue :
1
fYear :
1981
fDate :
1/1/1981 12:00:00 AM
Firstpage :
387
Lastpage :
394
Abstract :
The four primary areas of concern in the development of high performance dc SQUIDs are white noise, 1/f noise, readout schemes, and coupling. For an optimized dc SQUID the intrinsic energy sensitivity in the white noise region is given by εw1hkBT(eI0R)-12h, where Iois the critical current per junction and R is the shunt resistance per junction. γ1, which multiplies the thermal noise contribution, and γ2, which multiplies the shot noise/zero point fluctuation contribution, are numerical factors of order unity. Values of εwapproaching h have recently been measured for several members of a new generation of low noise dc SQUIDs. The intrinsic energy sensitivity in the 1/f noise region, εf, is predicted to scale as (I0R)2for tunnel junctions. This may impose significant low frequency limitations on SQUIDs with very low values of εw. Readout schemes for high sensitivity dc SQUIDs will require further development. At the moment primarily small signal amplifier readout schemes are being used to evaluate the new generation of low noise SQUIDs. Planar thin-film coupling schemes are about to have a big impact on dc SQUID design. Such schemes can achieve tight coupling between SQUID and input coil. and can be implemented using the same fabrication techniques that produce SQUIDs with low values of εw.
Keywords :
Bibliographies; Josephson devices; Critical current; DC generators; Fluctuations; Low-frequency noise; Noise generators; Noise measurement; SQUIDs; Thermal factors; Thermal resistance; White noise;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1981.1061180
Filename :
1061180
Link To Document :
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