Title :
Effect of periodic surface roughness on V(z) curves for the line-focus acoustic microscope
Author_Institution :
Center for Quality Eng. & Failure Prevention, Northwestern Univ., Evanston, IL, USA
Abstract :
A specimen with a periodic surface profile is considered to estimate the effect of surface roughness on the V(z) curve for the line-focus acoustic microscope. The Fourier optics approach is used to obtain the response of the lens and the Rayleigh-Fourier method is used to obtain the reflection coefficients for plane wave incidence from the fluid side on the periodic surface. An integral expression is obtained to calculate V(z) curves for periodic surface profiles. The V(z) curves are used to calculate the leaky Rayleigh wave velocities by applying the fast Fourier technique. Numerical results are presented to display the effect of sinusoidal surface roughness on the V(z) curves and the corresponding leaky Rayleigh wave velocities.<>
Keywords :
Fourier transform optics; Rayleigh waves; acoustic microscopes; fast Fourier transforms; numerical analysis; surface topography; Fourier optics approach; Rayleigh-Fourier method; fast Fourier technique; integral expression; leaky Rayleigh wave velocities; lens response; line-focus acoustic microscope; numerical method; periodic surface profile; periodic surface roughness effect; plane wave; reflection coefficients; sinusoidal surface roughness; Acoustic reflection; Displays; Lenses; Microscopy; Optical reflection; Optical surface waves; Rough surfaces; Surface acoustic waves; Surface roughness; Surface waves;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
