Title :
Residue number system error checking using expanded projection
Author_Institution :
University of Illinois, Department of Electrical Engineering and Coordinated Science Laboratory, Urbana, USA
Abstract :
A new concept called expanded projection is presented that simplifies the process of error detection and location in redundant residue number codes. Expanded projection simplifies the circuit complexity of the error checker, resulting in a structure which is potentially useful for VLSI implementation. It is expected that simplified designs for the error checker will result in more practical applications of residue number arithmetic to achieve fault tolerant performance in special-purpose digital processors.
Keywords :
codes; error correction; error detection; VLSI implementation; error checking; error detection; error location; expanded projection; fault tolerant performance; redundant residue number codes; residue number arithmetic; residue number system; special-purpose digital processors;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19820632