Title :
Dielectric constant of semi-insulating indium phosphide
Author :
Neidert, R.E. ; Binari, S.C. ; Weng, Tsu-Chien
Author_Institution :
Naval Research Laboratory, Washington, USA
Abstract :
Results are given on precision measurements of the relative dielectric constant of semi-insulating indium phosphide. It is concluded that the static value is within less than 0.5% of 12.55 based on a statistical average of a large number of measurements on several material samples.
Keywords :
III-V semiconductors; dielectric properties of solids; indium compounds; permittivity; relative dielectric constant; semiconductor; semiinsulating InP;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19820675
