DocumentCode :
982045
Title :
Scanning the issue
Author :
Alferness, R.C.
Author_Institution :
AT&T Bell laboratories, Holmdel, NJ
Volume :
75
Issue :
11
fYear :
1987
Firstpage :
1443
Lastpage :
1445
Abstract :
Provides an overview of the technical articles and features presented in this issue.
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1987.13906
Filename :
1458173
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=982045
