DocumentCode
982045
Title
Scanning the issue
Author
Alferness, R.C.
Author_Institution
AT&T Bell laboratories, Holmdel, NJ
Volume
75
Issue
11
fYear
1987
Firstpage
1443
Lastpage
1445
Abstract
Provides an overview of the technical articles and features presented in this issue.
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1987.13906
Filename
1458173
Link To Document