Title :
Near state-of-the-art power in p+-n-n+D-band IMPATT diode on a wafer with ramped n-n+interface
Author :
Singh, J.K. ; Gokgor, H.S. ; Howard, A.M. ; Myers, F.A.
Author_Institution :
CEERI, Pilani, Rajasthan, India
Abstract :
Fabrication of near state-of-the-art (P0= 110 mW, η = 4.85 percent p+-n-n+D band (f = 124 GHz) Si IMPATT diode on a wafer with ramped n-n+interface is described. Introduction of a critical annealing step, prior to p+diffusion, in the fabrication sequence of the diode has been found to yield the above results. Possible reasons for power and efficiency enhancement has been discussed.
Keywords :
Antenna measurements; Diodes; Electromagnetic scattering; Pollution measurement; Radar cross section; Radar scattering; Rotation measurement; Rough surfaces; Sensor phenomena and characterization; Surface roughness;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1987.13937