Title :
Phase-shift keying: symbol error rate in presence of random fluctuation noise¿an elementary treatment
Author_Institution :
Private Address, Kenley, UK
Abstract :
The symbol error rate in a multiple phase-shift-keying system is calculated by a method that differs from that adopted in the US technical literature. The stimulus for error creation is assumed to be random fluctuation noise.
Keywords :
phase shift keying; random noise; signal processing; multiple phase-shift-keying system; random fluctuation noise; signal processing; symbol error rate;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19820758
