DocumentCode
982896
Title
Cross-polarization measurements and their relation to target surface properties
Author
Krishen, K. ; Koepsel, W.W. ; Durrani, S.H.
Author_Institution
Kansas State Univ., Manhattan, KS, USA
Volume
14
Issue
5
fYear
1966
fDate
9/1/1966 12:00:00 AM
Firstpage
629
Lastpage
635
Abstract
It has often been suggested in lunar studies that measurements of radar cross-polarization factor
should yield information on the target\´s surface roughness and dielectric properties. This paper describes an experimental effort to obtain quantitative data on
, the average value of
, for randomly rough targets having Gaussian distribution of slopes. Bistatic
-band microwave measurements were conducted on targets with different dielectric constants but identical rough surfaces, and targets with same dielectrics but different statistics. The dependence of
on various parameters is shown graphically, and extension to M.I.T. data of lunar crosspolarization is discussed.
should yield information on the target\´s surface roughness and dielectric properties. This paper describes an experimental effort to obtain quantitative data on
, the average value of
, for randomly rough targets having Gaussian distribution of slopes. Bistatic
-band microwave measurements were conducted on targets with different dielectric constants but identical rough surfaces, and targets with same dielectrics but different statistics. The dependence of
on various parameters is shown graphically, and extension to M.I.T. data of lunar crosspolarization is discussed.Keywords
Extraterrestrial measurements; Radar target recognition; Dielectric constant; Dielectric measurements; Extraterrestrial measurements; Moon; NASA; Polarization; Radar remote sensing; Radar scattering; Rough surfaces; Surface roughness;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/TAP.1966.1138759
Filename
1138759
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