• DocumentCode
    982896
  • Title

    Cross-polarization measurements and their relation to target surface properties

  • Author

    Krishen, K. ; Koepsel, W.W. ; Durrani, S.H.

  • Author_Institution
    Kansas State Univ., Manhattan, KS, USA
  • Volume
    14
  • Issue
    5
  • fYear
    1966
  • fDate
    9/1/1966 12:00:00 AM
  • Firstpage
    629
  • Lastpage
    635
  • Abstract
    It has often been suggested in lunar studies that measurements of radar cross-polarization factor D should yield information on the target\´s surface roughness and dielectric properties. This paper describes an experimental effort to obtain quantitative data on \\langle D \\rangle , the average value of D , for randomly rough targets having Gaussian distribution of slopes. Bistatic X -band microwave measurements were conducted on targets with different dielectric constants but identical rough surfaces, and targets with same dielectrics but different statistics. The dependence of \\langle D \\rangle on various parameters is shown graphically, and extension to M.I.T. data of lunar crosspolarization is discussed.
  • Keywords
    Extraterrestrial measurements; Radar target recognition; Dielectric constant; Dielectric measurements; Extraterrestrial measurements; Moon; NASA; Polarization; Radar remote sensing; Radar scattering; Rough surfaces; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.1966.1138759
  • Filename
    1138759