Method for testing reflector antennas at THz frequencies

The possibilities of applying far-field, near-field, and compact-range techniques to reflector antennas in the THz frequency range are discussed. Other methods, such as defocusing and combining of the mechanical-reflector-surface measurements and the feed-horn-radiation patterns, are also discussed. A recently introduced hologram type of compact range is described. It may be concluded from the analysis of the different methods that the far-field method can be discarded due to atmospheric effects. The near-field method remains a possibility. However, an expensive, high-quality, moving stage is needed, and phase errors caused by flexible cables have to be dealt with. In some cases, a defocusing method, to bring the far field closer, may prove to be practical. Technically, the most-feasible and least-expensive method appears to be the hologram type of compact range. In this method, a planar-amplitude hologram is used to form the required plane wave. The hologram is inexpensive to manufacture, and it is also less sensitive to surface-accuracy errors than a reflector.<>