Title :
Experimentally determined equivalent network scattering parameters for edge slots in rectangular waveguide for use as reference data
Author :
McNamara, Derek A. ; Joubert, Johan
Author_Institution :
Dept. of Electr. & Electron. Eng., Pretoria Univ., South Africa
Abstract :
Tabulated, experimentally determined, scattering parameters for edge slots in the narrow wall of rectangular waveguide are given over a range of frequencies. The suggestion is that these tabulated results be used instead of graphs (extant in the literature since the 1940´s) from which it is difficult accurately to read off slot properties for comparison with theoretical techniques which may be proffered in future work by others.<>
Keywords :
S-parameters; equivalent circuits; rectangular waveguides; S-parameters; edge slots; equivalent network; narrow wall; rectangular waveguide; reference data; scattering parameters; tabulated results; Computer applications; Frequency measurement; Instruments; Integral equations; Intelligent networks; Measurement uncertainty; Moment methods; Rectangular waveguides; Scattering parameters; Testing;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
