• DocumentCode
    983168
  • Title

    Scaling of Nanowire Transistors

  • Author

    Yu, Bo ; Wang, Lingquan ; Yuan, Yu ; Asbeck, Peter M. ; Taur, Yuan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California-San Diego, San Diego, CA
  • Volume
    55
  • Issue
    11
  • fYear
    2008
  • Firstpage
    2846
  • Lastpage
    2858
  • Abstract
    This paper considers the scaling of nanowire transistors to 10-nm gate lengths and below. The 2-D scale length theory for a cylindrical surrounding-gate MOSFET is reviewed first, yielding a general guideline between the gate length and the nanowire size for acceptable short-channel effects. Quantum confinement of electrons in the nanowire is discussed next. It gives rise to a ground-state energy and, therefore, a threshold voltage dependent on the radius of the nanowire. The scaling limit of nanowire transistors hinges on how precise the nanowire size can be controlled. The performance limit of a nanowire transistor is then assessed by applying a ballistic current model. Key issues such as the density of states of the nanowire material are discussed. Comparisons are made between the model results and the published experimental data of nanowire devices.
  • Keywords
    MOSFET; ballistic transport; nanoelectronics; nanowires; semiconductor device models; semiconductor quantum wires; ballistic current model; ballistic transport; cylindrical surrounding-gate MOSFET; ground-state energy; nanowire transistors; quantum confinement; short-channel effects; transistor scaling; Effective mass; Electrons; Electrostatics; Fasteners; Guidelines; MOSFET circuits; Nanoscale devices; Potential well; Silicon; Threshold voltage; Ballistic transport; MOSFETs; nanowire; quantum confinement; scaling; short-channel effect (SCE);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.2005163
  • Filename
    4668604