• DocumentCode
    983482
  • Title

    Theoretical Study of Carrier Transport in Silicon Nanowire Transistors Based on the Multisubband Boltzmann Transport Equation

  • Author

    Jin, Seonghoon ; Fischetti, V. ; Tang, Ting-wei

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA
  • Volume
    55
  • Issue
    11
  • fYear
    2008
  • Firstpage
    2886
  • Lastpage
    2897
  • Abstract
    We study electronic transport in silicon nanowire transistors at room temperature based on the self-consistent numerical solution of the multisubband Boltzmann transport equation and Poisson equation. The Schrodinger equation with nonparabolic corrections is solved in order to obtain the multisubband structure. Relevant microscopic scattering mechanisms due to acoustic and intervalley phonons, surface roughness, and ionized impurities are included in the simulation. A flux-conserving discretization scheme based on the uniform total energy grid is employed to avoid excessive numerical diffusion originating from the conventional kinetic-energy-based upwind scheme. We report an interesting kink behavior in the output characteristics and study the electron energy distribution inside the transistor as a function of bias conditions and scattering mechanisms.
  • Keywords
    Boltzmann equation; Poisson equation; Schrodinger equation; impurities; nanoelectronics; nanowires; phonons; semiconductor device models; surface roughness; total energy; transistors; Poisson equation; Schrodinger equation; Si; acoustic phonon; carrier transport; electron energy distribution; flux-conserving discretization method; intervalley phonon; ionized impurities; kink; microscopic scattering mechanism; multisubband Boltzmann transport equation; multisubband structure; nonparabolic corrections; numerical diffusion; self-consistent numerical solution; silicon nanowire transistor; surface roughness; temperature 293 K to 298 K; total energy grid; Acoustic scattering; Boltzmann equation; Microscopy; Phonons; Poisson equations; Rough surfaces; Schrodinger equation; Silicon; Surface roughness; Temperature; Boltzmann transport equation (BTE); intersubband transition; microscopic scattering; quantum wires; quasi-ballistic transport; silicon nanowire transistors (SNWTs);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.2005172
  • Filename
    4668642