• DocumentCode
    984252
  • Title

    The effect of orientation, grain size and polymorphism on magnetic properties of sputtered Co-Re thin film media

  • Author

    Chen, Tu ; Yamashita, T. ; Sinclair, R.

  • Author_Institution
    Xerox PARC, Palo Alto, CA
  • Volume
    17
  • Issue
    6
  • fYear
    1981
  • fDate
    11/1/1981 12:00:00 AM
  • Firstpage
    3187
  • Lastpage
    3189
  • Abstract
    The correlation between the microstructure and the magnetic hysteretic properties was investigated. The analysis of the microstructure was made using a conventional and a 2½-D TEM analysis method. The results of the investigation show that the polymorphic transformation of HCP to FCC causes the decrease in grain size of the sputtered film. The effect of the grain size, preferred orientation and polymorphism on the value of Hcwas investigated from a series of equiaxial-shaped particle films. The results show that the dominant factor which influences the coercivity of the film is the grain size rather than the preferred orientation or the existence of isolated FCC crystallites in the film as the result of polymorphism. The squareness ratio, Mr/Mts, of the series of film was also investigated. The results show that the preferred orientation of the crystallites in the film affect the squareness of the loop.
  • Keywords
    Magnetic films; Sputtering; Coercive force; Crystallization; FCC; Grain size; Magnetic analysis; Magnetic films; Magnetic hysteresis; Magnetic properties; Microstructure; Sputtering;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1981.1061483
  • Filename
    1061483