DocumentCode
984252
Title
The effect of orientation, grain size and polymorphism on magnetic properties of sputtered Co-Re thin film media
Author
Chen, Tu ; Yamashita, T. ; Sinclair, R.
Author_Institution
Xerox PARC, Palo Alto, CA
Volume
17
Issue
6
fYear
1981
fDate
11/1/1981 12:00:00 AM
Firstpage
3187
Lastpage
3189
Abstract
The correlation between the microstructure and the magnetic hysteretic properties was investigated. The analysis of the microstructure was made using a conventional and a 2½-D TEM analysis method. The results of the investigation show that the polymorphic transformation of HCP to FCC causes the decrease in grain size of the sputtered film. The effect of the grain size, preferred orientation and polymorphism on the value of Hc was investigated from a series of equiaxial-shaped particle films. The results show that the dominant factor which influences the coercivity of the film is the grain size rather than the preferred orientation or the existence of isolated FCC crystallites in the film as the result of polymorphism. The squareness ratio, Mr /Mts , of the series of film was also investigated. The results show that the preferred orientation of the crystallites in the film affect the squareness of the loop.
Keywords
Magnetic films; Sputtering; Coercive force; Crystallization; FCC; Grain size; Magnetic analysis; Magnetic films; Magnetic hysteresis; Magnetic properties; Microstructure; Sputtering;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1981.1061483
Filename
1061483
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