DocumentCode
984309
Title
IRE Standards on Solid-State Devices: Measurement of Minority-Carrier Lifetime in Germanium and Silicon by the Method of Photoconductive Decay
Volume
49
Issue
8
fYear
1961
Firstpage
1292
Lastpage
1299
Keywords
Charge carrier lifetime; Germanium; Measurement standards; Particle measurements; Personnel; Photoconducting devices; Radiative recombination; Semiconductor device testing; Silicon; Solid state circuits;
fLanguage
English
Journal_Title
Proceedings of the IRE
Publisher
ieee
ISSN
0096-8390
Type
jour
DOI
10.1109/JRPROC.1961.287921
Filename
4066489
Link To Document