• DocumentCode
    984352
  • Title

    Probabilistic Interval-Valued Computation: Toward a Practical Surrogate for Statistics Inside CAD Tools

  • Author

    Singhee, Amith ; Fang, Claire F. ; Ma, James D. ; Rutenbar, Rob A.

  • Author_Institution
    IBM T J. Watson Res. Center, Yorktown Heights, NY
  • Volume
    27
  • Issue
    12
  • fYear
    2008
  • Firstpage
    2317
  • Lastpage
    2330
  • Abstract
    Interval methods offer a general fine-grain strategy for modeling correlated range uncertainties in numerical algorithms. We present a new improved interval algebra that extends the classical affine form to a more rigorous statistical foundation. Range uncertainties now take the form of confidence intervals. In place of pessimistic interval bounds, we minimize the probability of numerical "escape"; this can tighten interval bounds by an order of magnitude while yielding 10-100 times speedups over Monte Carlo. The formulation relies on the following three critical ideas: liberating the affine model from the assumption of symmetric intervals; a unifying optimization formulation; and a concrete probabilistic model. We refer to these as probabilistic intervals for brevity. Our goal is to understand where we might use these as a surrogate for expensive explicit statistical computations. Results from sparse matrices and graph delay algorithms demonstrate the utility of the approach and the remaining challenges.
  • Keywords
    circuit CAD; sparse matrices; statistics; CAD tools; confidence intervals; graph delay algorithms; interval algebra; probabilistic interval-valued computation; sparse matrices; statistics; Added delay; Algebra; Arithmetic; Circuits; Error analysis; Monte Carlo methods; Statistical distributions; Statistics; Timing; Uncertainty; Algorithms; arithmetic; design automation; error analysis; interval arithmetic; simulation; statistics; variational methods;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2008.2006142
  • Filename
    4670058