DocumentCode :
984643
Title :
Process optimization tweaking tool (POTT) and its application in controlling oxidation thickness
Author :
Guldi, Richard L. ; Jenkins, C. Dean ; Oamminga, G.M. ; Baum, Thomas A. ; Foster, Thomas A.
Author_Institution :
Texas Instrum., Dallas, TX, USA
Volume :
2
Issue :
2
fYear :
1989
fDate :
5/1/1989 12:00:00 AM
Firstpage :
54
Lastpage :
59
Abstract :
This computer utility extracts process data from a manufacturing statistical process control database, calculates oxidation times appropriate to recenter the thickness to the desired process mean, and inserts the values of new oxidation times directly into furnace oxidation recipes resident in the main BTU host computer so that production furnace recipes downloaded to the furnace controller automatically contain the new oxidation times. The major attributes of POTT are summarized and its application in controlling oxidation thickness for silicon integrated-circuit fabrication as well as results obtained using two different retargeting strategies are described
Keywords :
integrated circuit manufacture; oxidation; process computer control; statistical process control; POTT; Si; furnace controller; furnace oxidation recipes; integrated-circuit fabrication; manufacturing statistical process control database; oxidation thickness; oxidation times; process data; process optimization tweaking tool; retargeting strategies; Application software; Automatic control; Computer aided manufacturing; Data mining; Furnaces; Manufacturing automation; Manufacturing processes; Oxidation; Process control; Thickness control;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/66.24929
Filename :
24929
Link To Document :
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