Title :
Importance of unraveling memory propagation effects in interpreting data on partial discharge statistics
Author :
Van Brunt, R.J. ; Cernyar, E.W. ; von Glahn, P.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
12/1/1993 12:00:00 AM
Abstract :
The significance of memory propagation in controlling the stochastic behavior of partial-discharge phenomena is demonstrated by determination of various conditional amplitude and phase-of-occurrence distributions for both measured and simulated discharge pulses. A system that can be used to measure directly a set of both conditional and unconditional pulse amplitude and phase distributions needed to reveal memory effects and quantify the phase-resolved stochastic properties of partial-discharge pulses, is briefly described. It is argued that not only is an unraveling of memory effects essential in any attempt to understand the physical basis for the observed stochastic behavior of partial-discharge phenomena, but also that the data on conditional distributions provide additional statistical information that may be needed to optimize the reliability of partial-discharge pattern recognition schemes now being considered for use in insulation testing
Keywords :
charge measurement; impulse testing; insulation testing; partial discharges; pattern recognition; statistical analysis; stochastic processes; conditional amplitude distribution; data interpretation; insulation testing; memory propagation effects; partial discharge statistics; partial-discharge pattern recognition schemes; phase-of-occurrence distributions; phase-resolved stochastic properties; point-to-electrode gap; pulse amplitude distribution; real time stochastic analyzer; reliability; simulated discharge pulses; Information analysis; Insulation testing; NIST; Partial discharges; Pattern recognition; Phase measurement; Pulse measurements; Statistical distributions; Stochastic processes; Stochastic systems;
Journal_Title :
Electrical Insulation, IEEE Transactions on