• DocumentCode
    984882
  • Title

    Effect of sampling jitter on some sine wave measurements

  • Author

    Wagdy, Mahmound Fawzy ; Awad, Selim S.

  • Author_Institution
    Dept. of Electr. Eng., California State Univ., Long Beach, CA, USA
  • Volume
    39
  • Issue
    1
  • fYear
    1990
  • fDate
    2/1/1990 12:00:00 AM
  • Firstpage
    86
  • Lastpage
    89
  • Abstract
    The effect of sampling jitter on some periodic signal measurements, namely, the amplitude and phase of a pure sinusoid, is investigated. The parameters are determined by the fast Fourier transform (FFT) algorithm, which is used for manipulating samples in a data-acquisition system. Results are expressed in terms of mean values and variances of the measured parameters. Computer simulation results, based on Gaussian jitter, show the changes of amplitude and phase standard deviations versus the changes of standard deviation of jitter and signal amplitude for different numbers of FFT points
  • Keywords
    Fourier analysis; analogue-digital conversion; computerised signal processing; data acquisition; digital simulation; fast Fourier transforms; phase measurement; voltage measurement; FFT algorithm; Gaussian jitter; amplitude; computer simulation; data-acquisition; fast Fourier transform; mean values; periodic signal measurements; phase; sampling jitter; sine wave measurements; standard deviations; variances; Apertures; Computer simulation; Discrete Fourier transforms; Jitter; Phase measurement; Random variables; Sampling methods; Signal processing algorithms; Statistics; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.50422
  • Filename
    50422