Title :
Barkhausen noise characteristics of magnetoresistive sensors of different thicknesses
Author :
Decker, S.K. ; Dittmar, J. ; Tsang, C.
Author_Institution :
IBM Corporation, San Jose, CA, USA
fDate :
11/1/1981 12:00:00 AM
Abstract :
The thickness dependence of "Barkhausen" noise in thin film (≤ 1000Å) MR sensors of small aspect ratio has been studied. The qualitative nature of the noise jumps, as well as their quantity, is seen to vary strongly with thickness. A novel technique for studying these jumps is also reported.
Keywords :
Barkhausen effect; Magnetoresistive transducers; Permalloy films/devices; Band pass filters; Cutoff frequency; Displays; Magnetic fields; Magnetic sensors; Magnetic separation; Magnetoresistance; Sensor phenomena and characterization; Signal to noise ratio; Thin film sensors;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1981.1061542
