• DocumentCode
    985263
  • Title

    Bipolar effects on the signal delay time in HBTs at high currents

  • Author

    Zhou, Haosheng ; Pulfrey, David L.

  • Author_Institution
    Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
  • Volume
    40
  • Issue
    1
  • fYear
    1993
  • fDate
    1/1/1993 12:00:00 AM
  • Firstpage
    44
  • Lastpage
    48
  • Abstract
    The signal delay time for GaAs-based n-p-n HBTs operating at high current densities has been investigated using a phenomenological transport model. It is shown that once base pushout commences, the electronic contribution to the signal delay decreases because of the reduced intervalley scattering associated with the weakened electric field in the collector. However, more importantly for practical considerations, it is also shown that the overall signal delay time increases because of the dominant role played by the slow-moving holes in the base pushout process
  • Keywords
    III-V semiconductors; carrier mobility; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; GaAs; HBTs; base pushout; current densities; intervalley scattering; npn transistors; phenomenological transport model; signal delay time; slow-moving holes; weakened electric field; Charge carrier processes; Current density; Delay effects; Delay estimation; Gallium arsenide; Heterojunction bipolar transistors; Poisson equations; Scattering; Silicon; Space charge;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.249422
  • Filename
    249422