DocumentCode
985263
Title
Bipolar effects on the signal delay time in HBTs at high currents
Author
Zhou, Haosheng ; Pulfrey, David L.
Author_Institution
Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
Volume
40
Issue
1
fYear
1993
fDate
1/1/1993 12:00:00 AM
Firstpage
44
Lastpage
48
Abstract
The signal delay time for GaAs-based n-p-n HBTs operating at high current densities has been investigated using a phenomenological transport model. It is shown that once base pushout commences, the electronic contribution to the signal delay decreases because of the reduced intervalley scattering associated with the weakened electric field in the collector. However, more importantly for practical considerations, it is also shown that the overall signal delay time increases because of the dominant role played by the slow-moving holes in the base pushout process
Keywords
III-V semiconductors; carrier mobility; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; GaAs; HBTs; base pushout; current densities; intervalley scattering; npn transistors; phenomenological transport model; signal delay time; slow-moving holes; weakened electric field; Charge carrier processes; Current density; Delay effects; Delay estimation; Gallium arsenide; Heterojunction bipolar transistors; Poisson equations; Scattering; Silicon; Space charge;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.249422
Filename
249422
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