Title :
Threshold characteristics of Josephson interferometers
Author :
Imamura, T. ; Hasuo, S. ; Yamaoka, T.
Author_Institution :
Fujitsu Laboratories Ltd., Kawasaki, Japan
fDate :
11/1/1981 12:00:00 AM
Abstract :
Interferometers with two and three Josephson junctions were fabricated and their threshold characteristics were measured for various device dimensions. Experimental results are compared with calculated results including thin film and fringing effects, and good agreement is obtained.
Keywords :
Josephson devices; Counting circuits; Electrodes; Equivalent circuits; Inductance; Interferometers; Josephson junctions; Magnetic fields; Niobium compounds; Thin film circuits; Tunneling;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1981.1061588
