Diamond FET using high-quality polycrystalline diamond with fT of 45 GHz and fmax of 120 GHz

Using high-quality polycrystalline chemical-vapor-deposited diamond films with large grains (/spl sim/100 μm), field effect transistors (FETs) with gate lengths of 0.1 μm were fabricated. From the RF characteristics, the maximum transition frequency f_T and the maximum frequency of oscillation f_max were /spl sim/ 45 and /spl sim/ 120 GHz, respectively. The f_T and f_max values are much higher than the highest values for single-crystalline diamond FETs. The dc characteristics of the FET showed a drain-current density I/sub DS/ of 550 mA/mm at gate-source voltage V/sub GS/ of -3.5 V and a maximum transconductance g/sub m/ of 143 mS/mm at drain voltage V/sub DS/ of -8 V. These results indicate that the high-quality polycrystalline diamond film, whose maximum size is 4 in at present, is a most promising substrate for diamond electronic devices.