• DocumentCode
    985798
  • Title

    Structural analysis of the stabilization layer of chromium dioxide particles

  • Author

    Essig, U. ; Muller, M.W. ; Schwab, E.

  • Author_Institution
    BASF AG, Ludwigshafen, West Germany
  • Volume
    26
  • Issue
    1
  • fYear
    1990
  • fDate
    1/1/1990 12:00:00 AM
  • Firstpage
    69
  • Lastpage
    71
  • Abstract
    The stabilization layer of CrO2 particles has been investigated using high-resolution electron microscopy with a 400-keV instrument. The layer consists of β-CrOOH, which is formed topotactically from CrO2. Due to slight lattice mismatch, β-CrOOH is distorted; it appears as a hexagonal pattern in TEM pictures
  • Keywords
    chromium compounds; ferromagnetic properties of substances; magnetic properties of fine particles; surface structure; transmission electron microscope examination of materials; CrO2 particles; TEM pictures; beta CrOOH layer; hexagonal pattern; high-resolution electron microscopy; magnetic particles; slight lattice mismatch; stabilization layer; structural analysis; topotactic formation; Chromium;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.50493
  • Filename
    50493
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=985798