Title :
Structural analysis of the stabilization layer of chromium dioxide particles
Author :
Essig, U. ; Muller, M.W. ; Schwab, E.
Author_Institution :
BASF AG, Ludwigshafen, West Germany
fDate :
1/1/1990 12:00:00 AM
Abstract :
The stabilization layer of CrO2 particles has been investigated using high-resolution electron microscopy with a 400-keV instrument. The layer consists of β-CrOOH, which is formed topotactically from CrO2. Due to slight lattice mismatch, β-CrOOH is distorted; it appears as a hexagonal pattern in TEM pictures
Keywords :
chromium compounds; ferromagnetic properties of substances; magnetic properties of fine particles; surface structure; transmission electron microscope examination of materials; CrO2 particles; TEM pictures; beta CrOOH layer; hexagonal pattern; high-resolution electron microscopy; magnetic particles; slight lattice mismatch; stabilization layer; structural analysis; topotactic formation; Chromium;
Journal_Title :
Magnetics, IEEE Transactions on
