DocumentCode
985816
Title
New approach to the manufacture of low-threshold 1.5 ¿m distributed feedback lasers
Author
Westbrook, L.D. ; Nelson, A.W. ; Dix, C.
Author_Institution
British Telecom Research Laboratories, Ipswich, UK
Volume
19
Issue
11
fYear
1983
Firstpage
423
Lastpage
424
Abstract
Low-threshold-current (85 mA), oxide isolated InGaAsP/InP distributed feedback (DFB) lasers operating at a wavelength of ¿ = 1.5 ¿m have been produced for the first time using electron-beam-written DFB corrugations overgrown by MOCVD. The control and flexibility afforded by these techniques considerably ease the complexity of DFB laser manufacture.
Keywords
III-V semiconductors; chemical vapour deposition; distributed feedback lasers; electron beam lithography; gallium arsenide; indium compounds; p-n heterojunctions; semiconductor junction lasers; 1.5 micron wavelength; DFB laser manufacture; III-V semiconductors; InGaAsP/InP; MOCVD; corrugations; distributed feedback lasers; electron beam lithography; heterojunction device; oxide isolated; semiconductor laser;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19830290
Filename
4247756
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